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Non-Destructive Evaluation Failure site identification is a critical step in successful failure analysis. A recent breakthrough in detection technology, the scanning magnetic microscope (SMM), uses the magnetic fields given off by current-carrying traces/metallizations to pinpoint the location of shorts, opens, and other electrical faults.
The
NEOCERA Scanning Magnetic Microscope (SMM) is a sensitive near-field
imaging system for the measurement of weak magnetic fields.
The system can map out current carrying wires by measuring
the magnetic fields produced by the currents, or can be used
to image fields produced by magnetic materials. With a spatial
resolution of as low as 10 mm, this imaging system can be
used to accurately detect and locate shorts and opens in
integrated circuits and printed wiring boards.
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