This talk will focus on the significant improvements in exterior markings we are now seeing on clones. It is easier for counterfeits to pass first level inspection in some cases with professional marking. In addition, Tom will show his findings on the cross section layering comparison of clones vs authentic parts.

In this talk Mark will cover the following areas based on analysis of reported counterfeit data in the ERAI system.

• Does counterfeit activity fluctuate along with market demand?
• Most frequently reported part types
• Trends by year and part type
• Risks to military versus commercial sector
• Where are the counterfeit parts coming from?