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8th International Symposium on Tin Whiskers - Proceedings

Branched tin whiskers on bright tin.

The presentation line-up for the symposium is as follows: Access to Material

Individuals who registered for the 8th International Sysmposium can access the material with a ISTW2014 Web Account

CALCE EPSC members can access these presentations with their existing EPSC Web Accounts.

Access to all symposium proceedings with a CALCE Articles Web Account

Contact

Dr. Michael Osterman, CALCE, University of Maryland, osterman@calce.umd.edu

    Welcome, Michael Osterman, CALCE, College Park, Maryland, USA
    An investigation of tin whisker growth over a 32-year period, Barrie Dunn, European Space Agency, Noordwijk, the Netherlands
    Validation of the Dynamic Recrystallization (DRX) Mechanism for Whisker and Hillock Growth on Thin Films, Paul Vianco, Sandia National Labs, Albuquerque, New Mexico, USA
    Electrostatic theory of nucleation and growth of metal whiskers, V. G. Karpov, University of Toledo, Toledo, Ohio, USA
    SERDP Tin Whisker Testing and Modeling: Thermal Cycling Testing , Polina Snugovsky, Celestica, Toronto, Canada
    Whisker mitigation measurements using a test vehicle based on a printed circuit assembly, Martin Wickham, National Physical Laboratory (NPL), Teddington, England
    Platelet composite coatings for tin whisker mitigation, Lauren E.S. Rohwer, Sandia National Labs, Albuquerque, New Mexico, USA
    Development of Polyurethane Composite Coatings for Tin Whisker Mitigation, Junghyun Cho, Binghamton University (SUNY), Binghamton, New York, USA
    SERDP Tin Whisker Testing and Modeling: Simplified Whisker Geometric Short Circuit Risk Model Development, Stephan Meschter, BAE Systems, Endicott, New York, USA
    Case Study: Tin Whisker Risk Assessment of a Tin Surface Finished Connector, David Hillman, Rockwell Collins, Cedar Rapids, IA, USA
    Whisker Prevention and the Relevance of Plating Conditions, Werner Hügel, Robert Bosch, Stuttgart, Germany
    Tin Whisker Risk Management by Conformal Coating, Linda Woody, Lockheed, Ocala, FL, USA
Learn more about the Presenters.
The Center for Advanced Life Cycle Engineering (CALCE), the largest electronic products and systems research center focused on electronics reliability, is dedicated to providing a knowledge and resource base to support the development of competitive electronic components, products, and systems.

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